Getting ready to go to Berlin for EOSAM and then the big standards meeting there. This is the
general meeting of TC172, Optics and Photonics, along with a joint meeting of TC172 SC1
Fundamental Standards, and TC172 SC5 Microscopes and Endoscopes. We are really excited
about it because both our proposed new work items have been accepted by the committee!
There is a lot of hard work to do, but in a couple of years we will have an ISO version of the
American scratch and dig standard added to the ISO 10110 drawing notation standard, as well
as a complete overhaul of ISO 14997 for inspection methods for surface imperfections. Cool
stuff! Who says standards are boring?
